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Andrea Parisini is a senior researcher at the IMM Institute of the National Research Council (CNR) in Bologna. He graduated in Physics "cum laude" at the University of Bologna and received his PhD in Material Science from the University of Grenoble in 1989. As an electron microscopist, his works have concerned various aspects of the structural characterization of semiconductors and carbon-related materials whereas, more recently, he has focused his activity on quantitative methods in Z-contrast scanning transmission electron microscopy.
Scientific Productions
The role of self interstitials in As+ diffusion of implanted silicon
Microscopy of Semiconducting Materials, 1987 [CRC Press], Pages: 491-496
Thickness effects in Tilted Sample Annular Dark Field Scanning Transmission Electron Microscopy
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany [Springer, Berlin, Heidelberg], Pages: 145-146
Microscopy and Microanalysis [Cambridge University Press], Volume: 24 Issue: 3 Pages: 193-206
Nanotechnology [IOP Publishing], Volume: 28 Issue: 34 Pages: 345701
Virulence [Taylor & Francis], Volume: 8 Issue: 1 Pages: 66-73
Nano Energy [Elsevier], Volume: 30 Pages: 531-541
Size effect on high temperature variable range hopping in Al+ implanted 4H-SiC
Journal of Physics: Condensed Matter [IOP Publishing], Volume: 29 Issue: 3 Pages: 035703
ECS Journal of Solid State Science and Technology [IOP Publishing], Volume: 5 Issue: 10 Pages: P621
ECS Transactions [IOP Publishing], Volume: 75 Issue: 12 Pages: 171
ECS Transactions [The Electrochemical Society], Volume: 75 Issue: 12 Pages: 171-181
European journal of clinical pharmacology [Springer Berlin Heidelberg], Volume: 72 Issue: 7 Pages: 839-848
Journal of Antimicrobial Chemotherapy [Oxford University Press], Volume: 71 Issue: 6 Pages: 1637-1642
Infection [Springer Berlin Heidelberg], Volume: 43 Issue: 1 Pages: 107-109
A case of cerebral histoplasmosis in an immunocompetent host successfully treated with voriconazole
Infect Dis Trop Med [], Volume: 1 Pages: e90-2
IBA study of SiGe/SiO 2 nanostructured multilayers
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms [North-Holland], Volume: 331 Pages: 89-92
HIV clinical trials [Taylor & Francis], Volume: 15 Issue: 1 Pages: 45-50
parameters 31, 82, 83, whose determination has been, reported on
EXAFS and Near Edge Structure III: Proceedings of an International Conference, Stanford, CA, July 16–20, 1984 [Springer Science & Business Media], Volume: 2 Pages: 355
Journal of Applied Physics [AIP], Volume: 114 Issue: 13 Pages: 133706
Applied surface science [North-Holland], Volume: 278 Pages: 136-141
Journal of Ultrasound in Medicine [American Institute of Ultrasound in Medicine], Volume: 32 Issue: 5 Pages: 763-768
Charge trapping properties and retention time in amorphous SiGe/SiO2 nanolayers
Journal of Physics D: Applied Physics [IOP Publishing], Volume: 46 Issue: 9 Pages: 095306
Journal of Applied Physics [American Institute of Physics], Volume: 111 Issue: 10 Pages: 104323
Journal of Chemotherapy [Taylor & Francis], Volume: 24 Issue: 1 Pages: 56-58
Multidrug-resistant Pseudomonas aeruginosa bloodstream infections: risk factors and mortality
Epidemiology & Infection [Cambridge University Press], Volume: 139 Issue: 11 Pages: 1740-1749
A Luminescent Host-Guest Hybrid of a Eu (III) Complex and MWCNTs
ECS Meeting Abstracts [IOP Publishing], Issue: 40 Pages: 2409
A luminescent host–guest hybrid between a EuIII complex and MWCNTs
Chemistry–A European Journal [WILEY‐VCH Verlag], Volume: 17 Issue: 31 Pages: 8533-8537
Antimicrobial agents and chemotherapy [American Society for Microbiology Journals], Volume: 55 Issue: 7 Pages: 3485-3490
Antimicrobial Agents and Chemotherapy [American Society for Microbiology Journals], Pages: AAC. 00009-11
Electrical and structural properties of ultrathin SiON films on Si prepared by plasma nitridation
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena [American Vacuum Society], Volume: 29 Issue: 2 Pages: 022201
Characterisation of ultra-shallow disorder profiles and dielectric functions in ion implanted Si
Thin solid films [Elsevier], Volume: 519 Issue: 9 Pages: 2847-2851
Clinical Microbiology and Infection [Blackwell Publishing Ltd], Volume: 17 Issue: 2 Pages: 247-250
Journal of Vacuum Science and Technology-Section B [], Volume: 29 Issue: 2
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena [American Vacuum Society], Volume: 28 Issue: 1 Pages: C1C65-C1C70
AIP Conference Proceedings [American Institute of Physics], Volume: 1173 Issue: 1 Pages: 45-49
Comparison of electrical measurements with structural analysis of thin high-k hafnium-based films
ECS Transactions [IOP Publishing], Volume: 25 Issue: 3 Pages: 363
ECS Transactions [IOP Publishing], Volume: 25 Issue: 3 Pages: 349
Characterization of Near-Surface Defects Caused by Ultralow Energy Ion Implantation
ECS Meeting Abstracts [IOP Publishing], Issue: 22 Pages: 1996
ECS Meeting Abstracts [IOP Publishing], Issue: 22 Pages: 2007
Thickness Effects in Tilted Sample Annular Darkfield Scanning Transmission EM
Microscopy and Analysis-UK [], Issue: 132 Pages: 19
Carbon [Pergamon], Volume: 47 Issue: 3 Pages: 675-682
Applied Physics Letters [American Institute of Physics], Volume: 92 Issue: 26 Pages: 261907
Applied Surface Science [North-Holland], Volume: 254 Issue: 7 Pages: 2162-2167
Si Ultra Shallow Junctions Dopant Profiling with ADF-STEM
MRS Online Proceedings Library [Springer International Publishing], Volume: 1026 Issue: 1 Pages: 1-6
Wet adsorption of a luminescent EuIII complex on carbon nanotubes sidewalls
Advanced functional materials [WILEY‐VCH Verlag], Volume: 17 Issue: 15 Pages: 2975-2982
ECS Transactions [IOP Publishing], Volume: 10 Issue: 1 Pages: 57
Applied Physics Letters [American Institute of Physics], Volume: 91 Issue: 9 Pages: 092122
Applied physics letters [American Institute of Physics], Volume: 89 Issue: 4 Pages: 042111
Arsenic uphill diffusion during shallow junction formation
Journal of Applied Physics [American Institute of Physics], Volume: 99 Issue: 11 Pages: 113508
Silicon carbide nanocrystals growth on Si (100) and Si (111) from a chemisorbed methanol layer
Surface science [North-Holland], Volume: 600 Issue: 5 Pages: 1140-1146
High Temperature Variable Range Hopping in Heavy Al Implanted 4H-SiC
Materials Science Forum [Trans Tech Publications Ltd], Volume: 858 Pages: 283-286
Ultrafast Exciton Dynamics in Doubly Emitting Asymmetric Giant PbS/CdS/CdS Nanocrystals
The European Conference on Lasers and Electro-Optics [Optical Society of America], Pages: CE_5a_1
Responses to common vaccines in adolescents with HIV acquired perinatally
Infection [SPRINGER HEIDELBERG], Volume: 39 Pages: S69-S70
INFECTION [SPRINGER HEIDELBERG], Volume: 39 Pages: S65-S65
NON-HODGKIN LYMPHOMA IN HIV PATIENTS: INFECTIOUS COMPLICATIONS AND SURVIVAL RATE
INFECTION [SPRINGER HEIDELBERG], Volume: 39 Pages: S82-S82
Analytical Techniques for Semiconductor Materials and Process Characterization 6, ALTECH 2009-216th ECS Meeting [],
Intel European Research and Innovation Conference 2009 [],
Carbon nanotubes grown by catalytic CVD on silicon based substrates for electronics applications
Materials science forum [Trans Tech Publications Ltd], Volume: 539 Pages: 669-674
Competition between oxidation and recrystallization in ion amorphized (0001) 6H-SIC
Materials Science Forum [Trans Tech Publications Ltd], Volume: 483 Pages: 665-668